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Investigation of crystal growth under screw dislocation mechanisms on the (100) face of zinc tris (thiourea) sulphate (ZTS) crystals doped ethylene diamine tetraacetic acid (EDTA) has been carried out in a fluid cell by in situ atomic force microscopy (AFM). The generation of a dislocation spiral during the step advancing was observed. Through the measurement of the critical length of four sides of...
Titanium (Ti)-capped ZnO samples with different roughness were prepared to investigate the effect of ZnO morphology on surface plasma energy of ZnO/Ti interface. ZnO nanoparticle samples with diverse particle shapes, sizes and filling factors were obtained by annealing at different temperatures. Ti-capped ZnO films annealed at 700°C exhibit excellent photoluminescence property, which can attribute...
The V2O5 and CuxV2O5 films as the anode of V2O5/LiPON / LiCoO2 lithium microbatteries were prepared by RF magnetron sputtering method. The microbatteries were fabricated by micro electro-mechanical system (MEMS) technology. The films' structures, surface morphologies, and composition were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), and X-ray photoelectron spectroscopy...
The leakage current mechanism in Schottky contacts (SCs) to Al0.25Ga0.75N/GaN heterostructures incorporated by thin high-temperature (HT) AlN interlayer has been investigated using current-voltage measurements, atomic force microscopy, and deep level transient spectroscopy. The HT AlN interlayer thickness has a significant effect on the leakage current in SCs. The leakage current density is reduced...
200 nm thick InxAl1-xN epilayers around lattice-matched to GaN were grown on GaN templates by MOCVD. The elastic strain, surface morphology and crystalline quality of the InxAl1-xN were evaluated by high resolution X-ray diffraction (HRXRD) measurements, scanning electron microscopy (SEM) images and Rutherford backscattering spectroscopy (RBS) analyses. The strain effect, as while as the influences...
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