Search results for: Bo Sun
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 9 > 2380 - 2388
Microelectronics Reliability > 2015 > 55 > 9-10 > 1384-1390
Microelectronics Reliability > 2015 > 55 > 1 > 123-128
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 9 > 2380 - 2388
Microelectronics Reliability > 2015 > 55 > 9-10 > 1384-1390
Microelectronics Reliability > 2015 > 55 > 1 > 123-128