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Fourier Transform infrared reflection spectroscopy (incidence angle of 5 o ) was used to characterize thin films of sulfur dioxide and thin films containing water and sulfur dioxide in various ratios between 10 and 200K under a pressure of 10 -7 mbar. Pure solid sulfur dioxide begins to sublimate above 108K with an sublimation enthalpy of 29+/-3kJmol -1 .When sulfur...
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