Search results for: T. Ryan
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 108 - 114
IEEE Electron Device Letters > 2017 > 38 > 6 > 736 - 739
IEEE Electron Device Letters > 2017 > 38 > 3 > 326 - 329
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3851 - 3856
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3605 - 3613
2014 IEEE International Reliability Physics Symposium > 6B.1.1 - 6B.1.4
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 972 - 977
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2509 - 2514
The Bell System Technical Journal > 1970 > 49 > 7 > 1359 - 1376
2013 IEEE International Reliability Physics Symposium (IRPS) > 2D.5.1 - 2D.5.4