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This paper focuses on the design and implementation of a digital closed-loop control scheme to maintain the 180° phase shift of an interleaved Boundary-Conduction-Mode (BCM) boost converter. The closed-loop control scheme operates by differentially modulating the on-time of each phase to adjust the phase-shift. Zero-Current-Detection (ZCD) circuits control the turn-on instant for the MOSFET of each...
The performance and reliability of highly scaled devices are becoming increasingly dominated by transient phenomena. Recently, fast capacitances versus voltage (CV) measurements have been gaining attention as a promising measurement tool to characterize the transient phenomena. However, fast CV has mainly been limited to monitoring stress-induced deviations in accumulation capacitance due, at least...
Fast-CV measurements are frequently being used to study transient phenomena associated with advanced devices. In this study, we show that many artifacts plague this measurement and then provide a proper method to legitimize fast-CV measurements as trustworthy. We show a remarkably accurate correspondence between a complete fast CV measurement, from accumulation to inversion, and a conventional CV...
Critical parameters of low-k films were defined to keep capacitance benefit and TDDB reliability in the scaling BEOL module, according to various analyses. In order to meet the criteria of high carbon content, low porosity with small pores, and high adhesion strength with less adhesion layer, precursor and process were designed for the SiOCH with k∼2.5. The benefits in integration and reliability...
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