Wyniki wyszukiwania dla: T. Ryan
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 108 - 114
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3851 - 3856
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 972 - 977
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2509 - 2514
2013 IEEE International Reliability Physics Symposium (IRPS) > 2D.5.1 - 2D.5.4
2011 International Reliability Physics Symposium > 3A.4.1 - 3A.4.5