Search results for: T. Ryan
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3851 - 3856
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3605 - 3613
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 972 - 977
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2509 - 2514
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 2943 - 2949
2010 IEEE International Reliability Physics Symposium > 1122 - 1125
IEEE Transactions on Electron Devices > 2010 > 57 > 9 > 2047 - 2056