Search results for: Hyung‐Jun Kim
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3601 - 3608
2016 IEEE International Electron Devices Meeting (IEDM) > 25.4.1 - 25.4.4
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3601 - 3608
2016 IEEE International Electron Devices Meeting (IEDM) > 25.4.1 - 25.4.4