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Wire-bond lift-off and Solder fatigue are degradation mechanisms that dominate the lifetime of power semiconductor packages. Although their lifetime is commonly estimated at the design stage, based on mission profiles and physics-of-failure models, there are many uncertainties associated with such lifetime estimates, emerging, e.g., from model calibration errors, manufacturing tolerances, etc. These...
Historically, each discipline in power electronics has been pursued independently, and as a result, individual product classes, such as power modules, passive components, thermal management systems, gate drives and converters, have been developed without full consideration of the inter-component interactions. This serial approach to design and manufacture has reached its limit and further advances...
A novel double-side cooled power module is presented which delivers superior cooling performance with the potential for improved robustness to thermal cycling. The semiconductor dies are sandwiched between conventional DBC substrates, the substrates being directly cooled rather than through a conventional heat spreader heat sink assembly. A theoretical analysis is presented illustrating that direct...
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