Static test compaction procedures that modify tests perform the modification so as to increase the number of faults that some of the tests detect, thus making other tests unnecessary. Tests that become unnecessary are removed from the test set without reducing the fault coverage. This paper describes a static test compaction procedure of this type for transition faults that has the following additional feature. When the procedure modifies tests, it preserves the lengths of the paths through which transition faults are detected. This is important for preserving the ability of the test set to detect small delay defects. The procedure is structured to increase the lengths of the paths as it modifies tests even when it cannot reduce the number of tests. Experimental results for benchmark circuits demonstrate the extent to which it is possible to reduce the number of tests in an already-compact test set while preserving or increasing the path lengths.