IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 334 - 342
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 300 - 305
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 283 - 287
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 292 - 299
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 326 - 333
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 221 - 227
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 235 - 246
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 258 - 265
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 277 - 282
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 247 - 257
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 228 - 234
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 203 - 212
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 117 - 122
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 123 - 131
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 132 - 135
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 154 - 162
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 190 - 196
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 306 - 314
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 197 - 202
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 182 - 185