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2012 IEEE International Reliability Physics Symposium (IRPS) > 3A.5.1 - 3A.5.6
IEEE Electron Device Letters > 2010 > 31 > 7 > 728 - 730
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2004 > 51 > 7 > 896 - 907