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IEEE Electron Device Letters > 2013 > 34 > 1 > 99 - 101
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 316 - 322
IEEE Electron Device Letters > 2010 > 31 > 5 > 476 - 478
Transactions of the American Institute of Electrical Engineers > 1932 > 51 > 2 > 439 - 449