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IEEE Transactions on Reliability > 2014 > 63 > 1 > 144 - 153
2011 24th Internatioal Conference on VLSI Design > 147 - 152
2010 3rd International Congress on Image and Signal Processing > 6 > 3003 - 3007
2010 East-West Design&Test Symposium (EWDTS) > 438 - 441
2010 2nd International Conference on Future Computer and Communication > 1 > V1-808 - V1-812