Advanced search
Advanced search
IEEE Micro > 2016 > 36 > 3 > 31 - 41
IEEE Transactions on Reliability > 2014 > 63 > 1 > 144 - 153
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2010 > 29 > 3 > 341 - 354
IEEE Micro > 2016 > 36 > 3 > 31 - 41
IEEE Transactions on Reliability > 2014 > 63 > 1 > 144 - 153
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2010 > 29 > 3 > 341 - 354