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The testing and verification technology for system HDL models, focused to the significant improvement of the quality of design components for digital systems on chips and reduction the development time (time-to-market) by using the simulation environment, testable analysis of the logical structure HDL-program and the optimal placement of assertion engine is proposed.
The testing and verification technology for system HDL models, focused to the significant improvement of the quality of design components for digital systems on chips and reduction the development time (time-to-market) by using the simulation environment, testable analysis of the logical structure HDL-program and the optimal placement of assertion engine is proposed.
The testing and verification technology for system HDL models, focused to the significant improvement of the quality of design components for digital systems on chips and reduction the development time (time-to-market) by using the simulation environment, testable analysis of the logical structure HDL-program and the optimal placement of assertion engine is proposed.
Software-based self-test strategies have been mainly proposed to tackle microprocessor testing issues, but may also be applied to peripheral testing. However, testing highly embedded peripherals (e.g., DMA or Interrupt controllers) is a challenging task, since their observability and controllability are even more reduced compared to microprocessors and to peripherals devoted to I/O communication (e...
Today's SoCs are composed of a high variety of modules, such as microprocessor cores, memories, peripherals, and customized blocks directly related to the targeted application. Testing a peripheral core embedded in a SoC requires two correlated phases: module configuration and module operation. The first one prepares the peripheral on the different operation modes, whereas, the second one is in charge...
We propose a testing methodology for analog and radio-frequency (RF) circuitry that incorporates digital circuits for performance calibration and adaptation. We explore the reuse of built-in digital calibration circuitry, along with minor digital design-for-testability (DfT) modifications, to test and characterize analog/RF circuit performance. By observing the digital tuning signals captured in the...
The Niagara2 CMT system-on-chip incorporates many design-for-test features to achieve high test coverage for both arrays and logic. All the arrays are tested using memory built-in-self-test. This is supplemented with scan-based testing. Logic is tested with standard ATPG for slow-speed defects and extensive use of transition test, along with logic built-in-self-test for the SPARC cores, for at-speed...
Hundreds of memory instances and their frequency of operation have ruled out the possibility of sharing test structures amongst the embedded memories. This paper discusses the techniques and flow for sharing an embedded memory BIST for the at- speed testing of multiple memories on a typical SoC.
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