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IEEE Transactions on Industrial Electronics > 2018 > 65 > 1 > 16 - 26
IEEE Design & Test > 2017 > 34 > 6 > 63 - 76
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3369 - 3379
IEEE Electron Device Letters > 2017 > 38 > 11 > 1614 - 1617
IEEE Journal of Solid-State Circuits > 2017 > 52 > 11 > 3006 - 3017
IEEE Transactions on Power Electronics > 2017 > 32 > 11 > 8857 - 8867
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 10 > 1127 - 1131
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 10 > 3910 - 3921
IEEE Transactions on Energy Conversion > 2017 > 32 > 3 > 1117 - 1126
IEEE Transactions on Plasma Science > 2017 > 45 > 8-2 > 2150 - 2156
IEEE Transactions on Power Electronics > 2017 > 32 > 7 > 5827 - 5834
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 7 > 752 - 756
IEEE Transactions on Industry Applications > 2017 > 53 > 4 > 3814 - 3820
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 7 > 1058 - 1068
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 6 > 1299 - 1307
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 6 > 1540 - 1551
IEEE Transactions on Power Electronics > 2017 > 32 > 5 > 4048 - 4055
IEEE Transactions on Industry Applications > 2017 > 53 > 3-1 > 2200 - 2209
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 5-2 > 1914 - 1920
IEEE Transactions on Power Electronics > 2017 > 32 > 4 > 2892 - 2912