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2016 IEEE International Electron Devices Meeting (IEDM) > 4.1.1 - 4.1.4
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4288 - 4294
IEEE Electron Device Letters > 2016 > 37 > 10 > 1276 - 1279
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1877 - 1883
IEEE Electron Device Letters > 2016 > 37 > 5 > 584 - 587
IEEE Electron Device Letters > 2016 > 37 > 4 > 404 - 407
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 2158 - 2163
2013 IEEE International Reliability Physics Symposium (IRPS) > 5E.2.1 - 5E.2.6
IEEE Electron Device Letters > 2013 > 34 > 2 > 223 - 225
IEEE Electron Device Letters > 2013 > 34 > 2 > 220 - 222
IEEE Transactions on Magnetics > 2013 > 49 > 8-1 > 4582 - 4585
IEEE Electron Device Letters > 2013 > 34 > 1 > 108 - 110