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2010 East-West Design&Test Symposium (EWDTS) > 164 - 167
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 6 > 1011 - 1015
2009 46th ACM/IEEE Design Automation Conference > 386 - 389
2010 East-West Design&Test Symposium (EWDTS) > 164 - 167
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 6 > 1011 - 1015
2009 46th ACM/IEEE Design Automation Conference > 386 - 389