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2012 IEEE International Reliability Physics Symposium (IRPS) > CR.2.1 - CR.2.6
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 428 - 436
2011 International SoC Design Conference > 150 - 153
2011 International Reliability Physics Symposium > 2B.6.1 - 2B.6.5
2010 International Electron Devices Meeting > 4.3.1 - 4.3.4
Proceedings of the IEEE > 2010 > 98 > 10 > 1718 - 1751