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As dynamic random access memories (DRAMs) operate in the field, hard errors resulting from wearout occur. Unless corrected or repaired, hard errors halt normal operations, degrading the performance of a system and causing the replacement of memory modules. To improve performance and availability of memory modules, error-correcting codes (ECCs) are employed in a memory system. However, since recent...
The need to maintain and replace ageing equipment in South African national energy utility (ESKOM) and local municipalities has increased over the years. The country is currently experiencing power cuts from time to time inconveniencing factories and customers at large, as a result. This paper focuses only on the maintenance planning and execution of protection system of the utility distribution substations...
Nowadays integrated circuits (ICs) lose its integrity because aged ICs are being recycled in the new products instead of fresh ICs. Replacing ICs potentially impacts the security and reliability of the electronic systems bound for military, financial and other critical applications. It is important to distinguish the aged ICs from the unused ones. The term aging implies the duration of IC in constant...
This paper provides new methods to detect and investigate the failure in the DC filter of the power rectifier. The proposed diagnoses techniques are interested in two types of capacitor faults; capacitor aging and capacitor open circuit O.C. faults. The required inputs for the methods are the ripple of the DC voltage of the capacitors as well as the loading and the supply conditions.
The objective of using logic BIST for online and periodic testing is to identify defects, like opens, resulting from the wear and tear of the circuit. We have shown that existing test sets have a low coverage for open defects located in scan flip-flops, even though such defects may affect functional operation. Existing Logic BIST structures suffer from the same limitations. A novel Logic BIST architecture...
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