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In this paper, functional unit-based IDDT testing has been applied for a 90nm VLIW processor to monitor its aging degradation. This technique can provide health data for reliability evaluation as used in e.g. prognostic software for lifetime prediction. The test-program development based on the architecture of a single DSP processor, as well as implementation of an accelerated test (AT) is investigated...
Robust system design is becoming increasingly important, because of the ongoing miniaturization of integrated circuits, the increasing effects of aging mechanisms, and the effects of parasitic elements, both intrinsic and external. For safety reasons, particular emphasis is placed on robust system design in the automotive and aerospace sectors. Until now, the term robustness has been applied very...
In automotive mixed-signal SoCs, the analogue/mixed-signal front-ends are of particular interest with regard to dependability. Because of the many electrical disturbances at the front-end, often (active) filters are being used. Due to the harsh environments, in some cases, degradation of these filters may be encountered during lifetime and hence false sensor information could be provided with potential...
In this work a general concept for accelerated aging of linear analog circuit blocks is proposed. Due to the interaction of diverse aging mechanisms, circuit behavior in an arbitrary effect accelerated stress setup may show large deviation to the aging under nominal circuit conditions. The proposed analytical small signal analysis proves to be a fast and easy way to obtain the contributions of all...
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