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Enhanced Low Dose Rate Sensitivity of many BJT-STM transistors have been studied. The devices 2N2222AHR, 2N2907AHR, 2N5401HR, 2N5551HR, 2N3810HR and 2ST3360HR have been tested getting up to TID: 100Krad according to ESCC22900 specification. They have been tested with two different dose rate (10mrad/s and 100mrad/s) in two different biasing conditions (ON/OFF) with the aim of identify or verify the...
This paper presents information regarding a program of accelerated aging and seismic testing of electrical and electronic components used in safety related equipment which is located in mild environment areas of a nuclear power plant. The test methodology is responsive to IEEE Std. 323-1974 and IEEE Std. 344-1975 for Class 1E electrical equipment. The methods used in accelerated aging and seismic...
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