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IEEE Transactions on Reliability > 2017 > 66 > 4 > 1073 - 1084
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2503 - 2509
Journal of KONBiN > 2011 > No. 4 (20) > 17--28
Reliability Engineering and System Safety > 2010 > 95 > 12 > 1293-1299
2008 Fourth International Conference on Natural Computation > 7 > 669 - 673