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IEEE Transactions on Reliability > 2017 > 66 > 2 > 529 - 546
Integration, the VLSI Journal > 2017 > 58 > C > 189-214
ISGT 2014 > 1 - 5
IEEE Security & Privacy > 2010 > 8 > 1 > 43 - 49
IEEE Transactions on Reliability > 2017 > 66 > 2 > 529 - 546
Integration, the VLSI Journal > 2017 > 58 > C > 189-214
ISGT 2014 > 1 - 5
IEEE Security & Privacy > 2010 > 8 > 1 > 43 - 49