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IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3922 - 3927
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1246 - 1254
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.5.1 - MY.5.4
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3767 - 3774
2012 IEEE International Reliability Physics Symposium (IRPS) > 6C.2.1 - 6C.2.6
IEEE Electron Device Letters > 2012 > 33 > 9 > 1267 - 1269
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 2910 - 2916
IEEE Electron Device Letters > 2011 > 32 > 11 > 1486 - 1488
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 924 - 930
Proceedings of the IEEE > 2010 > 98 > 12 > 2201 - 2227
IEEE Transactions on Electron Devices > 2010 > 57 > 8 > 1838 - 1845
IEEE Electron Device Letters > 2008 > 29 > 1 > 41 - 43