Advanced search
Advanced search in people
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2835 - 2841
IEEE Electron Device Letters > 2016 > 37 > 9 > 1143 - 1146
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 2205 - 2209
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2992 - 2997
2013 IEEE International Reliability Physics Symposium (IRPS) > 5E.1.1 - 5E.1.7
IEEE Electron Device Letters > 2013 > 34 > 1 > 114 - 116
IEEE Electron Device Letters > 2012 > 33 > 3 > 429 - 431
IEEE Electron Device Letters > 2011 > 32 > 3 > 363 - 365
IEEE Transactions on Applied Superconductivity > 2011 > 21 > 3-2 > 1348 - 1353
2008 IEEE Sensors > 1580 - 1583
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 8 > 1786 - 1790