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2011 International Reliability Physics Symposium > 2F.3.1 - 2F.3.7
IEEE Transactions on Electron Devices > 2011 > 58 > 10 > 3369 - 3378
2010 International Electron Devices Meeting > 2.1.1 - 2.1.4
2010 International Electron Devices Meeting > 2.4.1 - 2.4.4