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IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 296 - 305
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 225 - 232
2011 International Reliability Physics Symposium > 3F.1.1 - 3F.1.7
2010 International Electron Devices Meeting > 2.1.1 - 2.1.4
2010 International Electron Devices Meeting > 2.4.1 - 2.4.4
IEEE Transactions on Industry Applications > 2010 > 46 > 5 > 2046 - 2055