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IEEE Electron Device Letters > 2015 > 36 > 4 > 300 - 302
2015 IEEE International Reliability Physics Symposium > 6B.3.1 - 6B.3.6
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 666 - 673
2013 IEEE International Reliability Physics Symposium (IRPS) > XT.9.1 - XT.9.4
2010 2nd International Conference on Future Computer and Communication > 2 > V2-330 - V2-332
IEEE Sensors Journal > 2008 > 8 > 7 > 1236 - 1242