Search results
IEEE Electron Device Letters > 2018 > 39 > 1 > 4 - 7
IEEE Transactions on Industrial Electronics > 2017 > 64 > 11 > 8782 - 8785
IEEE Transactions on Nuclear Science > 2017 > 64 > 10 > 2633 - 2638
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4018 - 4024
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3998 - 4001
IEEE Transactions on Industrial Electronics > 2017 > 64 > 10 > 8334 - 8343
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 507 - 513
IEEE Transactions on Power Electronics > 2017 > 32 > 6 > 4491 - 4502
IEEE Transactions on Power Electronics > 2017 > 32 > 6 > 4776 - 4784
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2478 - 2484
IEEE Electron Device Letters > 2017 > 38 > 6 > 705 - 707
IEEE Transactions on Industrial Informatics > 2017 > 13 > 3 > 1271 - 1279
IEEE Electron Device Letters > 2017 > 38 > 5 > 677 - 680
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2142 - 2147
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 163 - 169
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1007 - 1014
IEEE Journal of the Electron Devices Society > 2017 > 5 > 2 > 107 - 111
IEEE Electron Device Letters > 2017 > 38 > 2 > 160 - 163
IEEE Access > 2017 > 5 > 17772 - 17780
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 4913 - 4918