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IEEE Transactions on Computers > 2018 > 67 > 1 > 102 - 114
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 12 > 1954 - 1967
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3138 - 3151
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3991 - 3997
IEEE Transactions on Power Electronics > 2017 > 32 > 7 > 5323 - 5340
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 307 - 315
IEEE Transactions on Power Electronics > 2017 > 32 > 5 > 3683 - 3690
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1455 - 1466
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 113 - 120
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 3 > 1012 - 1022
IEEE Transactions on Industry Applications > 2017 > 53 > 1 > 305 - 318
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 597 - 603
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 522 - 531
IEEE Journal of Solid-State Circuits > 2016 > 51 > 11 > 2786 - 2798
IEEE Transactions on Circuits and Systems II: Express Briefs > 2016 > 63 > 11 > 1034 - 1038
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2722 - 2728
IEEE Design & Test > 2016 > 33 > 3 > 37 - 45
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 112 - 116
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2517 - 2523