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IEEE Transactions on Power Electronics > 2018 > 33 > 3 > 1890 - 1896
IEEE Electron Device Letters > 2018 > 39 > 1 > 95 - 98
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 299 - 307
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 667 - 671
IEEE Transactions on Nuclear Science > 2017 > 64 > 11 > 2883 - 2890
IEEE Journal of Photovoltaics > 2017 > 7 > 6 > 1603 - 1610
IEEE Journal of Photovoltaics > 2017 > 7 > 6 > 1591 - 1595
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4327 - 4334
IEEE Transactions on Nuclear Science > 2017 > 64 > 10 > 2678 - 2682
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 5 > 1558 - 1564
IEEE Transactions on Terahertz Science and Technology > 2017 > 7 > 5 > 586 - 592
IEEE Journal of the Electron Devices Society > 2017 > 5 > 5 > 390 - 394
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3786 - 3793
IEEE Electron Device Letters > 2017 > 38 > 8 > 1090 - 1093
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 4-2 > 1329 - 1338
Journal of Lightwave Technology > 2017 > 35 > 14 > 3042 - 3049
IEEE Transactions on Nanotechnology > 2017 > 16 > 4 > 695 - 702
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 6 > 925 - 935
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 6 > 936 - 943
Journal of Microelectromechanical Systems > 2017 > 26 > 3 > 653 - 661