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IEEE Transactions on Nuclear Science > 2013 > 60 > 6-2 > 4737 - 4743
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 425 - 430
IEEE Electron Device Letters > 2008 > 29 > 7 > 788 - 790
Solid State Electronics > 2006 > 50 > 5 > 727-732