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IEEE Electron Device Letters > 2010 > 31 > 4 > 287 - 289
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 425 - 430
IEEE Electron Device Letters > 2008 > 29 > 7 > 788 - 790
IEEE Electron Device Letters > 2010 > 31 > 4 > 287 - 289
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 425 - 430
IEEE Electron Device Letters > 2008 > 29 > 7 > 788 - 790