Search results
Microelectronics Reliability > 2017 > 76-77 > C > 145-148
Physica B: Condensed Matter > 2009 > 404 > 23-24 > 4645-4648
Nuclear Inst. and Methods in Physics Research, B > 2002 > 186 > 1-4 > 355-359
Microelectronics Reliability > 2017 > 76-77 > C > 145-148
Physica B: Condensed Matter > 2009 > 404 > 23-24 > 4645-4648
Nuclear Inst. and Methods in Physics Research, B > 2002 > 186 > 1-4 > 355-359