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The Gate-Induce-Drain-Leakage (GIDL)-assisted body biasing for erase, which is a technique essential to enabling 3DNAND Flash CMOS Under Array architectures, has been extensively studied and successfully optimized to achieve high-performance, reliable erase operation. This paper reviews the main features of GIDL-assisted body biasing and GIDL optimization methods ensuring the best erase effectiveness...
A new reliability assessment method for distribution system with distributed generations (DGs) is proposed in this paper, aiming to quantitatively analyze the undesired impact caused by passive islanding detection failure. Firstly, the paper analyzes the impacts of DG interconnection on auto-reclosing operation and system reliability due to failure of anti-islanding detection when a transient or permanent...
The solution of optimal load curtailment for the selected system contingency states is the most important step for the reliability analysis of composite power system. The linear reactive remedial model considering the bus voltage and reactive power constrains was formulated first based on the decoupled AC load flow model. Aiming at dealing with the discrete control variables in the reactive power...
With the decrease of the size of lead-free solder joints, the reliability of solder joints is particularly prominent, which is critical to the mechanical behavior of solder joints. While in the actual production process, the stresses for solder joints are often complex. In this paper, the nano-indentation is used to obtain the mechanical behaviors and the step behaviors of Sn3.0Ag0.5Cu and Sn0.3Ag0...
To assess electrical and reliability performance of CPV modules of China, a test bed of CPV module I-V characteristics is established in the Institute of Electrical Engineering of Chinese Academy of Sciences in Beijing. The relative and absolute output power of CPV modules are measured using test methods of both IEC 62108 and ASTM E 2527. I-V characteristics under CPV Standard Test Condition (CSTC)...
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