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Search results for: C. Barry Carter

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article

Characterizing Li in partially lithiated layer materials using atomic‐resolution imaging, modeling, and simulation

Chanchal Ghosh, Manish Kumar Singh, Shayani Parida, Arthur Dobley, more

Journal of the American Ceramic Society > 105 > 2 > 1581 - 1595

Understanding of phase‐stability and nanoscale structural modulation during lithiation of layer materials demand comprehensive analysis of the Li‐containing phases in the solid‐state reaction products. Conventional chemical analysis methods in the transmission electron microscope (TEM) are not ideal to detect Li in partially intercalated nanodomains because Li atoms do not remain stationary under...

article

Vertically Stacked 2H‐1T Dual‐Phase MoS₂ Microstructures during Lithium Intercalation: A First Principles Study

Shayani Parida, Avanish Mishra, Jie Chen, Jin Wang, more

Journal of the American Ceramic Society > 103 > 11 > 6603 - 6614

Layered transition‐metal dichalcogenides (TMDs) have shown promise to replace carbon‐based compounds as suitable anode materials for Lithium‐ion batteries (LIBs) owing to facile intercalation and de‐intercalation of lithium (Li) during charging and discharging, respectively. While the intercalation mechanism of Li in mono‐ and bi‐layer TMDs has’ been thoroughly examined, mechanistic understanding...

article

Electrospinning amorphous SiO2-TiO2 and TiO2 nanofibers using sol-gel chemistry and its thermal conversion into anatase and rutile

Fei Huang, Behrooz Motealleh, Wenjian Zheng, Matthew T. Janish, more

Ceramics International > 2018 > 44 > 5 > 4577-4585

SiO₂-TiO₂ nanofibers were electrospun from partially hydrolyzed tetraethyl orthosilicate, and titanium isopropoxide using sol-gel chemistry. SiO₂-TiO₂ sol phase diagrams were created summarizing the role of composition on solution homogeneity and electrospinnability. Inorganic nanofiber spinnability was studied without the addition of any organic polymer, oligomer, gelator, or binder. TiO₂ concentration...

article

The new Editors

C. Barry Carter

Journal of Materials Science > 2018 > 53 > 2 > 847-850

article

All authors must now supply ORCID identifiers

C. Barry Carter, Christopher F. Blanford

Journal of Materials Science > 2017 > 52 > 11 > 6147-6149

chapter

Processing and Quantifying Images

David B. Williams, C. Barry Carter

Transmission Electron Microscopy > Imaging > 549-578

In this chapter we will equate processing with the use of the computer to analyze our data. We will simply use image processing to extract more information from the data than we can obtain by eye. The data will generally be an HRTEM image but could be other images or DPs. We’ll quantify spectra after we describe them in Part 4 of this text. In the past, the optical bench was also used for this purpose,...

chapter

Bloch Waves

David B. Williams, C. Barry Carter

Transmission Electron Microscopy > Diffraction > 235-243

This topic is rather mathematical, with long sequences of differential equations. The discussion of Bloch waves given here follows the treatment of Hirsch et al. which, in turn, was based on the original analysis of electron diffraction by Bethe (1928). The notation we will use closely follows that used by Bethe. Remember that g can be any reciprocal-lattice vector, although we will also use it to...

chapter

Electron Sources

David B. Williams, C. Barry Carter

Transmission Electron Microscopy > Basics > 73-89

A reliable source of electrons to ‘illuminate’ the specimen is one of themost important parts of a TEM. Fortunately, electron sources are plentiful, but to get the best images and other signals out of our expensive microscope, we need to use the best available source. There are stringent requirements to produce the beam of electrons with the necessary properties and these are best met by only two...

chapter

Using Convergent-Beam Techniques

David B. Williams, C. Barry Carter

Transmission Electron Microscopy > Diffraction > 347-368

In the preceding chapter, we described how to obtain a variety of CBED patterns under various experimental conditions. In this chapter you will find out why these patterns are so useful: they contain a wealth of quantitative data, much of which you can’t obtain by any other technique and many of which augment standard X-ray crystallographic methods (but always at higher spatial resolution). The established...

chapter

Obtaining and Indexing Parallel-Beam Diffraction Patterns

David B. Williams, C. Barry Carter

Transmission Electron Microscopy > Diffraction > 283-309

The core strength ofTEMis that you can obtain both a DP and an image from the same part of your specimen (not to mention various spectra). To obtain the crystallographic data, a method for interpreting and indexing the DP is essential and this aspect is the theme for the next four chapters. We’ll start in this chapter by considering classic selected-area diffraction (SAD) patterns (SADPs) and how...

chapter

Specimen Preparation

David B. Williams, C. Barry Carter

Transmission Electron Microscopy > Basics > 173-193

Specimen preparation is a very broad subject; there are books devoted to this topic alone. The intention here is to summarize the techniques, suggest routes that you might follow, and above all to emphasize that there are many ways to produce a TEM specimen; the one you choose will depend on the information you need, time constraints, availability of equipment, your skill, and the material. So we’ll...

chapter

Planar Defects

David B. Williams, C. Barry Carter

Transmission Electron Microscopy > Imaging > 419-439

Internal interfaces (grain boundaries, phase boundaries, stacking faults) or external interfaces (i.e., surfaces) are surely the most important defects in crystalline engineering materials. Their common feature is that we can usually think of them as all being two-dimensional, or planar, defects (even though they’re not really). The main topics of this chapter will be ■ Characterizing which type of...

chapter

Weak-Beam Dark-Field Microscopy

David B. Williams, C. Barry Carter

Transmission Electron Microscopy > Imaging > 463-481

The term ‘weak-beam microscopy’ refers to the formation of a diffraction-contrast image in either BF or DF where the useful information is transferred by weakly excited beams. The DF approach has been more widely used, in part because it can be understood using quite simple physical models. It also gives stronger contrast; we see white lines on a dark gray background. This chapter will be concerned...

chapter

Phase-Contrast Images

David B. Williams, C. Barry Carter

Transmission Electron Microscopy > Imaging > 389-405

We see phase contrast any time we have more than one beam contributing to the image. In fact, whenever we say “fringes,” we are essentially referring to a phase-contrast phenomenon. Although we often distinguish phase and diffraction contrast, this distinction is generally artificial. For example, in Chapters 24 and 25, we will examine thickness fringes and stackingfault fringes; both types of contrast...

chapter

X-ray Spectra and Images

David B. Williams, C. Barry Carter

Transmission Electron Microscopy > Spectrometry > 605-623

TheX-ray spectrumgenerated within your specimen consists of element-specific characteristic peaks with well-defined energies superimposed on a non-characteristic background. While the XEDS system is a remarkable piece of technology, we’ve already described its limited resolution and we will see in this chapter that it is also prone to creating small artifact peaks in the spectrum. Furthermore, the...

chapter

Qualitative X-ray Analysis and Imaging

David B. Williams, C. Barry Carter

Transmission Electron Microscopy > Spectrometry > 625-638

It is a waste of time to proceed with quantitative analysis of your XEDS spectrum or image without first carrying out qualitative analysis. Qualitative analysis requires that every peak in the spectrum be identified unambiguously, with statistical certainty, otherwise it should be ignored for both subsequent quantitative analysis and imaging. We emphasize this point because of the many opportunities...

chapter

Image Simulation

David B. Williams, C. Barry Carter

Transmission Electron Microscopy > Imaging > 533-548

When we need to obtain information about the specimen in two directions, we need to align the specimen close to a low-index zone axis. If theHRTEMimage information is going to be directly interpretable, the specimen must be oriented with the incident beam exactly aligned with both the optic axis of the TEM and the zone axis of the specimen. Thus, we will have many reflections excited and the simple...

chapter

Elastic Scattering

David B. Williams, C. Barry Carter

Transmission Electron Microscopy > Basics > 39-51

Elastically scattered electrons are the major source of contrast in TEM images. They also create much of the intensity in DPs, so we need to understand what controls this process. First we’ll consider elastic scattering from single, isolated atoms and then from many atoms together in the specimen. To comprehend elastic scattering we need to invoke both particle and wave characteristics of electrons.

chapter

Thinking in Reciprocal Space

David B. Williams, C. Barry Carter

Transmission Electron Microscopy > Diffraction > 211-219

In the previous chapter, you’ve already encountered vectors k and g and seen that they have lengths with units of nm⁻¹. These vectors are referred to as reciprocal-lattice vectors. Now we are going to discuss what this reciprocal lattice is. The reciprocal lattice is simply a lattice in reciprocal space. Note that this lattice is just as real as the ‘real lattice’ in ‘real’ space. It’s like a new...

chapter

Pumps and Holders

David B. Williams, C. Barry Carter

Transmission Electron Microscopy > Basics > 127-140

In the past three chapters we’ve described the sources, lenses, and detectors that make up a TEM. The only other parts of the instrument you need to know about in detail are those that, if you are not careful, can seriously degrade the quality of the information you generate even if the rest is perfect. These two parts are the holder in which you put your specimen and the vacuum that surrounds it...

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