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Digital microfluidic(DMF) biochips have emerged recently as a viable platform of implementing conventional laboratory-based biochemical procedures. These tiny chips are able to manipulate nanoliter volume of discrete fluid dropletson an electrode array via electrical actuation. However, with the increasing dimension of the array, the number of external control pins connected to the electrodes may...
A common scenario in industry today is “No Trouble Found” (NTF) due to functional failures. A component on a board fails during board-level functional test, but it passes the Automatic Test Equipment (ATE) test when it is returned to the supplier for warranty replacement or service repair. To find the root cause of NTF, we define an innovative deterministic test, namely functional scan test. We also...
Hardware fault-insertion test is a promising method to diagnose functional failures and target ''no trouble found (NTF)" problems in electronic systems. However, it is costly and impractical to equip all the potential fault sites with fault-insertion hardware. We present an optimization method to select the most effective outputs of a module where fault insertion logic must be placed to facilitate...
For sub-nanometer designs, testing for small-delay defects (SDDs) is essential to achieve low defect escapes for the manufactured silicon. Existing solutions for testing SDDs are not practical for high-volume production environments due to large pattern count or long compute time, or both. In this paper, we present a production-friendly method that takes the circuit topology into account while generating...
Although LFSR reseeding based on test cubes for modeled faults is an efficient test compression approach, it suffers from the drawback of limited, and often unpredictable, coverage of unmodeled defects. We present a new defect coverage-driven window-based LFSR reseeding technique, which offers both high test quality and high compression. The efficiency of the proposed encoding technique in detecting...
Testing for small-delay defects (SDDs) is necessary for ensuring product quality in smaller technology nodes. Current tools such as transition-delay fault (TDF) ATPGs and timing-aware ATPGs are either inefficient in detecting SDDs or suffering from large pattern count and CPU runtime. Furthermore, none of these methodologies take into account the impact of pattern-induced noises, e.g., power supply...
Digital micro fluidic technology is now being extensively used for implementing a lab-on-a-chip. Micro fluidic biochips are often used for safety-critical applications, clinical diagnosis, and for genome analysis. Thus, devising effective and faster testing methodologies to warrant correct operations of these devices after manufacture and during bioassay operations, is very much needed. In this paper,...
Digital micro fluidic biochips with non-regular arrays are of interest for clinical diagnostic applications in a cost-sensitive market segment. Previous techniques for biochip testing are limited to regular micro fluidic arrays. We present an automatic test pattern generation (ATPG) method for non-regular digital micro fluidic chips. The ATPG method can generate test patterns to detect catastrophic...
Advances in droplet-based digital microfluidics have led to the emergence of biochips for automating laboratory procedures in biochemistry and molecular biology. These devices enable the precise control of microliter of nanoliter volumes of biochemical samples and reagents. They combine electronics with biology, and integrate various bioassay operations, such as sample preparation, analysis, separation,...
Three-dimensional (3D) ICs promise to overcome barriers in interconnect scaling by leveraging fast, dense inter-die vias, thereby offering benefits of improved performance, higher memory bandwidth, smaller form factors, and heterogeneous integration. However, when deciding to adopt this emerging technology as a mainstream design approach, designers must consider the cost of 3D integration. IC testing...
Scan shift power can be reduced by activating only a subset of scan cells in each shift cycle. In contrast to shift power reduction, the use of only a subset of scan cells to capture responses in a cycle may cause capture violations, thereby leading to fault coverage loss. In order to restore the original fault coverage, new test patterns must be generated, leading to higher test-data volume. In this...
Functional test sequences play an important role in manufacturing test for targeting defects that are not detected by structural test. In practice, functional tests are often derived from existing design-verification test sequences and they suffer from low defect coverage. Therefore, there is a need to increase their effectiveness using design-for-testability (DFT) techniques. We present a non-scan...
Diagnosis of functional failures is critical for locating manufacturing defects, increasing yield, and reducing field returns. It is important to narrow down the defective module in a failed component during board-level diagnosis. In this paper, a generic fault-diagnosis method based on an error-flow dictionary is presented to identify the root cause of functional failures on a chip or board. Error...
Testing of three-dimensional (3D) stacked ICs (SICs) is starting to receive considerable attention in the semiconductor industry. Since the die-stacking steps of thinning, alignment, and bonding can introduce defects, there is a need to test multiple subsequent partial stacks during 3D assembly. We address the problem of test-architecture optimization for 3D stacked ICs to minimize overall test time...
A new general scheme for robust model reference adaptive controller (MRAC) is proposed for single variable nonlinear plants and can be applied without any modifications to single variable nonlinear plants, both time-invariant and time varying in nature. The proposed robust MRAC is based on the estimation of the difference between the linear time-invariant model plant parameters and actual plant parameters...
Microfluidics-based biochips are revolutionizing high-throughput sequencing, parallel immunoassays, blood chemistry for clinical diagnostics, and drug discovery. These devices enable the precise control of nanoliter volumes of biochemical samples and regents. They combine electronics with biology, and they integrate various bioassay operations, such as sample preparation, analysis, separation, and...
Microfluidics-based biochips are revolutionizing high-throughput sequencing, parallel immunoassays, clinical diagnostics, and drug discovery. These devices enable the precise control of nanoliter volumes of biochemical samples and reagents. Compared to conventional laboratory procedures, which are cumbersome and expensive, miniaturized biochips offer the advantages of higher sensitivity, lower cost...
This paper is purely a model to determine the design circuit to implement Partial Discharge (PD) detection in FPGA technology. The research shall involve ISE Simulator version 10.1i (Xilinx) and ISE Xilinx Synthesized Technology (XST) using Very high integrated circuit Hardware Description Language (VHDL) programming to evaluate the use of Field Programming Gate Array (FPGA) for the detection and...
Currently, FPGA (Field Programmable Gate Array) technology is being widely used for accelerator control owing to its fast digital processing capability. This paper is purely a model to determine the design circuit to implement Partial Discharge (PD) detection in FPGA technology. The research shall involve ISE Simulator version 9.2i (Xilinx) and Very high integrated circuit Hardware Description Language...
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