2010 IEEE 16th International On-Line Testing Symposium > 229 - 234
Source
Abstract
Identifiers
book ISBN : | 978-1-4244-7724-1 |
book e-ISBN : | 978-1-4244-7723-4 , 978-1-4244-7722-7 |
DOI | 10.1109/IOLTS.2010.5560197 |
book ISBN : | 978-1-4244-7724-1 |
book e-ISBN : | 978-1-4244-7723-4 , 978-1-4244-7722-7 |
DOI | 10.1109/IOLTS.2010.5560197 |