Search results for: Cagatay Ozmen
Journal of Electronic Testing > 2018 > 34 > 4 > 405-415
Journal of Electronic Testing > 2016 > 32 > 2 > 227-233
IEEE Transactions on Circuits and Systems I: Regular Papers > 2014 > 61 > 8 > 2491 - 2504
Journal of Electronic Testing > 2018 > 34 > 4 > 405-415
Journal of Electronic Testing > 2016 > 32 > 2 > 227-233
IEEE Transactions on Circuits and Systems I: Regular Papers > 2014 > 61 > 8 > 2491 - 2504