Search results for: Yoocharn Jeon
IEEE Electron Device Letters > 2017 > 38 > 7 > 871 - 874
2015 IEEE International Electron Devices Meeting (IEDM) > 10.3.1 - 10.3.4
IEEE Electron Device Letters > 2017 > 38 > 7 > 871 - 874
2015 IEEE International Electron Devices Meeting (IEDM) > 10.3.1 - 10.3.4