Search results for: Benjamin Gojman
IEEE Design & Test > 2017 > 34 > 6 > 54 - 62
Low-Power Variation-Tolerant Design in Nanometer Silicon > Low-Power and Robust Reconfigurable Computing > 381-432
IEEE Design & Test > 2017 > 34 > 6 > 54 - 62
Low-Power Variation-Tolerant Design in Nanometer Silicon > Low-Power and Robust Reconfigurable Computing > 381-432