Search results for: Igor Aleksejev
IEEE Instrumentation & Measurement Magazine > 2017 > 20 > 4 > 23 - 30
Journal of Electronic Testing > 2016 > 32 > 3 > 245-255
IEEE Instrumentation & Measurement Magazine > 2017 > 20 > 4 > 23 - 30
Journal of Electronic Testing > 2016 > 32 > 3 > 245-255