Search results for: Otavio Lima
Journal of Electronic Testing > 2018 > 34 > 4 > 417-433
Metals and Materials International > 2015 > 21 > 3 > 429-439
Journal of Electronic Testing > 2018 > 34 > 4 > 417-433
Metals and Materials International > 2015 > 21 > 3 > 429-439