Search results for: J. Virkki
Electronics Letters > 2017 > 53 > 15-Regular Papers > 1054 - 1056
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 429 - 431
Microelectronics Reliability > 2014 > 54 > 4 > 840-846
Electronics Letters > 2014 > 50 > 21 > 1504 - 1505
Microelectronics Reliability > 2010 > 50 > 9-11 > 1650-1653
Microelectronics Reliability > 2010 > 50 > 9-11 > 1711-1714
Microelectronics Reliability > 2010 > 50 > 8 > 1121-1124
Microelectronics Reliability > 2010 > 50 > 2 > 217-219