Search results for: Yilong Chen
Microelectronics Reliability > 2017 > 71 > Complete > 134-142
International Journal of Fatigue > 2016 > 87 > C > 216-224
Microelectronics Reliability > 2017 > 71 > Complete > 134-142
International Journal of Fatigue > 2016 > 87 > C > 216-224