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2017 IEEE International Reliability Physics Symposium (IRPS) > 5C-1.1 - 5C-1.7
IEEE Electron Device Letters > 2013 > 34 > 1 > 99 - 101
IEEE Transactions on Industrial Electronics > 2011 > 58 > 7 > 2636 - 2643
IEEE Transactions on Instrumentation and Measurement > 2011 > 60 > 5 > 1674 - 1681
IEEE Electron Device Letters > 2010 > 31 > 5 > 473 - 475