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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 4 > 614 - 623
2010 15th IEEE European Test Symposium > 145 - 150
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 4 > 614 - 623
2010 15th IEEE European Test Symposium > 145 - 150