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IEEE Electron Device Letters > 2017 > 38 > 7 > 871 - 874
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 5 > 1622 - 1631
2016 IEEE International Reliability Physics Symposium (IRPS) > MY-8-1 - MY-8-5
IEEE Electron Device Letters > 2015 > 36 > 10 > 1030 - 1032
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 8 > 1815 - 1828
IEEE Electron Device Letters > 2014 > 35 > 6 > 636 - 638
IEEE Journal of the Electron Devices Society > 2014 > 2 > 6 > 154 - 157
IEEE Electron Device Letters > 2013 > 34 > 10 > 1292 - 1294
IEEE Electron Device Letters > 2013 > 34 > 10 > 1250 - 1252
IEEE Electron Device Letters > 2012 > 33 > 7 > 1060 - 1062
IEEE Electron Device Letters > 2011 > 32 > 11 > 1579 - 1581